新闻与活动
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UNITYSC RECEIVES MULTIPLE ORDERS FOR WAFER THINNING INSPECTION SYSTEMS
Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications Grenoble, France, May 9, 2017 – UnitySC, a leader in advanced inspection and metrology solutions, today announced multiple orders from a leading...
SEMICON West
San Francisco, CA 1 year ago, UnitySC was launched at SEMICON West 2016. What a busy year with so many achievements since July 2016! Stop by our booth to learn about our full advanced process control product portfolio for heterogeneous integration. UnitySC will be...
CEO Interview: Chip Equipment Supplier on a Rocket Trajectory
Metrology and inspection company Unity Semiconductor SAS (Grenoble, France), is experiencing strong growth and expects to double its sales year-on-year in 2017. We asked CEO Gilles Fresquet to explain why and provide some background. [eeNews Europe] Read more
Advanced Packaging & System Integration Technology Symposium
Wuxi, China Dario Alliata, Product Manager, will deliver a talk entitled "Advanced Packaging Process Control for High Volume Manufacturing". In addition, our Business Development team will be attending to meet with attendees and promote our product offer.
UnitySC Pushes the Boundaries of Measurement With New Nanotopography Metrology Platform
NST Series Provides Non-Contact Full Field Profilometry to 0.1nm Resolution; Delivers Unique Overlay Solution for Hybrid Bonding Grenoble, France, March 14, 2017 – UnitySC, a wholly owned subsidiary of FOGALE Nanotech Group and a leader in inspection and metrology...
ECTC
Lake Buena Vista, Florida ECTC is the premier international conference on microelectronic packaging, components, and systems technology. UnitySC is proud to be Gold Sponsor of ECTC. We will be exhibiting in booth #219 and showcasing our full product portfolio of...