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UNITYSC RECEIVES MULTIPLE ORDERS FOR WAFER THINNING INSPECTION SYSTEMS

由 kaiss.benhadjsalem@unity-sc.com | 5 月 9, 2017 | Press releases

Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications Grenoble, France, May 9, 2017 – UnitySC, a leader in advanced inspection and metrology solutions, today announced multiple orders from a leading...

UnitySC Pushes the Boundaries of Measurement With New Nanotopography Metrology Platform

由 kaiss.benhadjsalem@unity-sc.com | 3 月 14, 2017 | Press releases

NST Series Provides Non-Contact Full Field Profilometry to 0.1nm Resolution; Delivers Unique Overlay Solution for Hybrid Bonding Grenoble, France, March 14, 2017 – UnitySC, a wholly owned subsidiary of FOGALE Nanotech Group and a leader in inspection and metrology...

FOGALE Nanotech Group Subsidiary UnitySC Opens New Global Headquarters in Grenoble, France

由 kaiss.benhadjsalem@unity-sc.com | 1 月 23, 2017 | Press releases

Grenoble, France, Jan. 23, 2017 – UnitySC, a wholly owned subsidiary of FOGALE Nanotech Group and a leader in inspection and metrology solutions for advanced semiconductor packaging, today announced the opening of its global headquarters in Grenoble, France, the heart...

FOGALE Nanotech, A leader in advanced metrology solutions for semiconductor manufacturing, acquired Altatech

由 kaiss.benhadjsalem@unity-sc.com | 4 月 15, 2016 | Press releases

Delivering leading-edge full process control tools and software for advanced semiconductor manufacturing & enabling more than Moore to become a reality Nimes, France, April 15, 2016 – FOGALE Nanotech today announced that it has acquired Altatech, a specialized...
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