WOTAN
Automated Optical Inspection (AOI) solutionsWOTAN: a unique AOI solution with Full-Color Optics and Simultaneous-Dual-Sided Inspection capabilities.
WOTAN is a high speed AOI tool, with fully automatic-recipe-setup, meaning no parameter selection is needed by human users.
Uniquely in the market, WOTAN uses full colour optics enabling better Sensitivity & Classification (versus the typical Black & White optics of other AOI systems).
The WOTAN has simultaneous front and back side inspection and is able to automatically detect macro sized defects as well as wafer-to-wafer differences.
A key application is high throughput process monitoring and tool control, with easy-to-read instant result display options that enable short defect elimination cycle-times.
WOTAN is available as a stand-alone tool, or in combination with an Edge inspection module.
Exploring WOTAN Key Use-Cases
- High Device Mix fabs, with large numbers’s of recipes, who want to minimize human / operator involvement
- Litho Defocus & Field-Tilt issues
- Colour Defect Detection & Binning
- Wafer Level Defect Signature Detection
- Backside Roughness Monitoring
- Backside Defectivity Monitoring
- Automated Scribe Line Masking