NEWS & EVENTS
Welcome to UnitySC, the hub for all things semiconductor.
Stay updated with our latest news, events, insider stories,
and job opportunities.
Process Control solutions for Advanced Packaging – Advanced Semiconductor Technology Conference
During the ASTC conference held in Marina Bay Sands Convention Centre - Singapore, the 7th and 8th of November 2019, Unity Semiconductor will present a paper entitled : Process Control solutions for Advanced Packaging You can already read below...
“Technologies development driven by MEMS challenges” at MEMS World Summit 2019
Mr Mathieu NOEL, Product Line Manager for Metrology solutions at UnitySC, will present a paper during the MEMS World Summit, the 11th and 12th November 2019 at the Hilton Munich Park Hotel. The paper subject will be "Technologies development driven by MEMS...
Unity SC opens a new location in Germany
UNITY SC OPENS A NEW LOCATION IN GERMANY Montbonnot-Saint-Martin, the 12th of September 2019. Unity SC is deploying rapidly the strategic execution plan to differentiate in the market, and adapting its resources globally to address the fast growth. At the same time,...
GREENTROPISM and UNITYSC’s Collaboration
GreenTropism and UnitySC sign MoU to collaborate tackling Molecular contamination identification on Advance Packaging issues using advanced sensing and artificial intelligence Taiwan, September 17, 2019 - GreenTropism a leading French startup on artificial...
Inspection and metrology challenges for power device manufacturing
Driven by automotive market growing, power devices are now requested to fulfill the Zero-Defect policy edicted by Power Device Manufacturers leading the market. Much more than adapting old technologies and equipment to this new challenge, specific solutions are...
LIGHTSpEED by UNiTYSC: The new high-end surface inspection solution for in-line monitoring and process qualification of opaque and transparent substrates
The LIGHTSpEED is the first unpatterned surface inspection solution that combines darkfield inspection and advanced synchronous doppler detection technology to capture nanometer scale defects on all kind of wafers. Grenoble, France – Tuesday, July 9th, 2019 – UnitySC,...